Delay Variability Analysis

Delay Variability Analysis is a methodological framework within subthreshold circuit design that characterizes the statistical fluctuations in signal propagation delay caused by process, voltage, and temperature variations, distinguishing it from deterministic delay analysis by explicitly accounting for uncertainty and intra-die variability in ultra-low-power operational regimes.

124

Publications

5.4K

Citations

361

Authors

123

Institutions

Publications per year

2017–2026

10

Authors

361

  1. HO
    Hidetoshi Onodera

    Kyoto University, Japan

    7 publications · 176 citations

    7

    h-index

  2. YC
    Yu Cao

    Arizona State University, United States

    4 publications · 208 citations

    4

    h-index

  3. PS
    Pete Sedcole

    Imperial College London, United Kingdom

    4 publications · 195 citations

    4

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  4. DB
    David Blaauw

    University of Michigan, United States

    4 publications · 274 citations

    4

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  5. AG
    Anne Gattiker

    IBM Research - Austin, United States

    3 publications · 216 citations

    3

    h-index

1–5 of 361

Venues

  1. 7

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  2. 7

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  3. 4

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  4. 2

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  5. IEEE Transactions on Electron Devices

    2 publications · 43 citations

    2

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1–5