Configuration Memory Reliability

Configuration Memory Reliability is a metric that quantifies the resilience and consistency of configuration data retention and retrieval in reconfigurable computing systems under operational and environmental variations.

39

Publications

1.5K

Citations

100

Authors

36

Institutions

Publications per year

2017–2026

10

Authors

100

  1. LS
    Luca Sterpone

    Politecnico di Torino, Italy

    17 publications · 575 citations

    13

    h-index

  2. MV
    M. Violante

    Politecnico di Torino, Italy

    13 publications · 514 citations

    12

    h-index

  3. MW
    Michael Wirthlin

    Brigham Young University, United States

    8 publications · 483 citations

    8

    h-index

  4. MS
    M. Sonza Reorda

    Politecnico di Torino, Italy

    6 publications · 239 citations

    6

    h-index

  5. AP
    A. Paccagnella

    University of Padua, Italy

    5 publications · 203 citations

    5

    h-index

1–5 of 100

Venues

  1. IEEE Transactions on Nuclear Science

    10 publications · 434 citations

    10

    h-index

  2. ScholarsArchive (Brigham Young University)

    Repository · 2 publications · 94 citations

    2

    h-index

  3. 1

    h-index

  4. Microelectronics Reliability

    1 publications · 13 citations

    1

    h-index

  5. 1

    h-index

1–5