Bias Sensitivity Analysis

Bias Sensitivity Analysis is a methodological framework used in transistor biasing that systematically evaluates the stability of a transistor's operating point by quantifying its dependence on variations in biasing parameters, distinguishing it from general stability analyses through its explicit focus on parametric sensitivity in DC bias conditions.

38

Publications

3.1K

Citations

182

Authors

92

Institutions

Publications per year

2017–2026

6

Authors

182

  1. KF
    Keith F. Brill

    NOAA National Centers for Environmental Prediction, United States

    2 publications · 68 citations

    2

    h-index

  2. WD
    Wim De Neys

    Centre National de la Recherche Scientifique, France

    2 publications · 135 citations

    2

    h-index

  3. AT
    A.R. Tokuda

    University of Washington, United States

    1 publications · 10 citations

    1

    h-index

  4. XD
    Xiaopeng Deng

    Southeast University, China

    1 publications · 73 citations

    1

    h-index

  5. RD
    Ronald D. Schrimpf

    Vanderbilt University, United States

    1 publications · 73 citations

    1

    h-index

1–5 of 182

Venues

  1. IEEE Transactions on Electron Devices

    4 publications · 192 citations

    4

    h-index

  2. IEEE Transactions on Nuclear Science

    2 publications · 147 citations

    2

    h-index

  3. Weather and Forecasting

    2 publications · 68 citations

    2

    h-index

  4. IEEE Journal of Solid-State Circuits

    2 publications · 27 citations

    2

    h-index

  5. Neural Computation

    1 publications · 19 citations

    1

    h-index

1–5