Wei Dong Zhang

Energy Distribution of Positive Charges in Gate Dielectric: Probing Technique and Impacts of Different Defects

Sharifah Fatmadiana Wan Muhamad Hatta, Zhigang Ji, J. F. Zhang et al. · IEEE Transactions on Electron Devices · 2013 · 59 citations

Wide-bandgap Semiconductor, Engineering, Gate Dielectric +16

An Investigation on Border Traps in III–V MOSFETs With an In_0.53Ga_0.47As Channel

Zhigang Ji, Xiong Zhang, J. Franco et al. · IEEE Transactions on Electron Devices · 2015 · 51 citations · Full text

Semiconductors, Semiconductor Technology, Electrical Engineering +10

A Single Pulse Charge Pumping Technique for Fast Measurements of Interface States

Long-Yi Lin, Zhigang Ji, J. F. Zhang et al. · IEEE Transactions on Electron Devices · 2011 · 51 citations

Engineering, Charge Transport, High Voltage Engineering +16

New Analysis Method for Time-Dependent Device-To-Device Variation Accounting for Within-Device Fluctuation

Meng Duan, J. F. Zhang, Zhigang Ji et al. · IEEE Transactions on Electron Devices · 2013 · 38 citations

Engineering, Measurement, Nanometer-size Devices +20

Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation

Rui Gao, Azrif Manut, Zhigang Ji et al. · IEEE Transactions on Electron Devices · 2017 · 38 citations