Xiang Liu - Concepedia

Author

Xiang Liu

University of California, Santa Barbara ORCID

Also Known As

Xiang Liu

Publications

260

Citations

H-Index

Concepts

All Affiliations

University of California, Santa Barbara

About

Xiang Liu is an author at University of California, Santa Barbara specializing in engineering, electrical engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	153
2	Electrical Engineering	7	7	153
3	Applied Physics	6	6	141
4	Computer Engineering	1	1	12
5	Computer Science	1	1	12

Xiang Liu

Publications

202

Citations

H-Index

Page 1

	Year	Citations
Capacitance-voltage characterization of interfaces between positive valence band offset dielectrics and wide bandgap semiconductors Ramya Yeluri, Xiang Liu, Brian L. Swenson, Journal of Applied Physics SemiconductorsWide-bandgap SemiconductorElectrical EngineeringSemiconductor DeviceEngineering	2013	39
Annealing of P3HT:PCBM Blend Film—The Effect on Its Optical Properties Annie Ng, Xiang Liu, Chap Hang To, ACS Applied Materials & Interfaces	2013	35
Effects of H2O Pretreatment on the Capacitance–Voltage Characteristics of Atomic-Layer-Deposited Al2O3 on Ga-Face GaN Metal–Oxide–Semiconductor Capacitors Xiang Liu, Ramya Yeluri, Jing Lu, Journal of Electronic Materials Materials ScienceWide-bandgap SemiconductorElectrical EngineeringCapacitance–voltage CharacteristicsEngineering	2012	34
Metalorganic chemical vapor deposition and characterization of (Al,Si)O dielectrics for GaN-based devices Silvia H. Chan, Maher Tahhan, Xiang Liu, Japanese Journal of Applied Physics Materials ScienceSemiconductorsElectrical EngineeringWide-bandgap SemiconductorEngineering	2016	21
Commercially Available N-polar GaN HEMT Epitaxy for RF Applications Davide Bisi, Brian Romanczyk, Xiang Liu, SemiconductorsManufacturing FacilityElectrical EngineeringRf ApplicationsEngineering	2021	17
Dielectric stress tests and capacitance-voltage analysis to evaluate the effect of post deposition annealing on Al2O3 films deposited on GaN Ramya Yeluri, Xiang Liu, Matthew Guidry, Applied Physics Letters Aluminium NitrideEngineeringNanoelectronicsDielectric Stress TestsAl2o3 Films	2014	15
Atom probe tomography studies of Al2O3 gate dielectrics on GaN B. Mazumder, Xiang Liu, Ramya Yeluri, Journal of Applied Physics Materials ScienceAluminium NitrideElectrical EngineeringWide-bandgap SemiconductorEngineering	2014	15
High temperature resistant thin film thermocouple prepared based on inkjet printing Jiaming Lei, Bian Tian, Xiang Liu, Ceramics International	2024	14
Trap-Assisted Passing Word Line Leakage and Variable Retention Time in DRAM Yumeng Sun, Xiang Liu, Noakim Wang, 2021 IEEE 4th International Conference on Electronics Technology (ICET) Non-volatile MemoryEngineeringVariable Retention TimeComputer ArchitectureDram Chips	2021	12

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