Juergen Christen

Analysis of point defects in AlN epilayers by cathodoluminescence spectroscopy

B. Bastek, F. Bertram, Juergen Christen et al. · Applied Physics Letters · 2009 · 40 citations

Materials Science, Systematic Cathodoluminescence Study, Aluminium Nitride +12

Excitonic transport in ZnO

Martin Noltemeyer, F. Bertram, Thomas Hempel et al. · Journal of materials research/Pratt's guide to venture capital sources · 2012 · 25 citations

Quantum Science, Excitonic Transport, Engineering +8

Low-temperature/high-temperature AlN superlattice buffer layers for high-quality AlxGa1−xN on Si (111)

Phannee Saengkaew, A. Dadgar, Juergen Blaesing et al. · Journal of Crystal Growth · 2009 · 22 citations

Materials Engineering, Materials Science, Aluminium Nitride +5

Dislocation reduction in GaN grown by hydride vapor phase epitaxy via growth interruption modulation

Wei Zhang, Stephan Roesel, H. Alves et al. · Applied Physics Letters · 2001 · 17 citations

Materials Science, Wide-bandgap Semiconductor, Electrical Engineering +15

Spectral Electroluminescence Mapping of a Blue InGaN Single Quantum Well Light-Emitting Diode

Peter Fischer, Juergen Christen, Shuji Nakamura · Japanese Journal of Applied Physics · 2000 · 16 citations

Optical Materials, Engineering, Optoelectronic Devices +18