M Terao

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa et al. · Journal of Electron Microscopy · 2009 · 76 citations

Engineering, Microscopy, Optic Design +17

Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector

Hidetaka Sawada, Fumio Hosokawa, T. Kaneyama et al. · Japanese Journal of Applied Physics · 2007 · 64 citations

Engineering, Microscopy, Spherical Aberration Corrector +19

High spatiotemporal-resolution imaging in the scanning transmission electron microscope

Ryo Ishikawa, Yu Jimbo, M Terao et al. · Microscopy · 2020 · 47 citations

Engineering, Microscopy, X-ray Imaging +22

Higher-order aberration corrector for an image-forming system in a transmission electron microscope

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa et al. · Ultramicroscopy · 2010 · 46 citations

Engineering, Electron Microscopy, Physics +13

Development of a 200kV Atomic Resolution Analytical Electron Microscope

Thomas Isabell, Jaap Brink, Masahiro Kawasaki et al. · Microscopy Today · 2009 · 12 citations

Optical Materials, Engineering, Microscopy +18