Publication | Closed Access
Higher-order aberration corrector for an image-forming system in a transmission electron microscope
46
Citations
15
References
2010
Year
EngineeringElectron MicroscopyPhysicsMicroscopyOptical PropertiesMicroscopy MethodApplied PhysicsHigher-order Aberration CorrectorElectron MicroscopeImage-forming SystemComputational ImagingGeometrical AberrationOptical System AlignmentInstrumentationTransmission Electron MicroscopeElectron Optic
| Year | Citations | |
|---|---|---|
Page 1
Page 1