T. Kaneyama

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

Hidetaka Sawada, Y. Tanishiro, Naoki Ohashi et al. · Journal of Electron Microscopy · 2009 · 170 citations

Dumbbell Image, Engineering, Microscopy +16

Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage

Kazu Suenaga, Yuta Sato, Zheng Liu et al. · Nature Chemistry · 2009 · 162 citations

Engineering, Electron Microscopy, Physics +12

Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy

Yoshifumi Oshima, Hidetaka Sawada, Fumio Hosokawa et al. · Microscopy · 2010 · 102 citations · Full text

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

Takeo Sasaki, Hidetaka Sawada, F. Hosokawa et al. · Journal of Electron Microscopy · 2010 · 102 citations

Measurement method of aberration from Ronchigram by autocorrelation function

Hidetaka Sawada, Takumi Sannomiya, F. Hosokawa et al. · Ultramicroscopy · 2008 · 87 citations

Engineering, Measurement, Calibration +7