STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

Hidetaka Sawada, Y. Tanishiro, Naoki Ohashi, +5

Journal of Electron Microscopy

Dumbbell ImageEngineeringMicroscopyElectron DiffractionPm Spacing +14

Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage

Kazu Suenaga, Yuta Sato, Zheng Liu, +9

Nature Chemistry

EngineeringElectron MicroscopyPhysicsMicroscopyNatural Sciences +10

Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy

Yoshifumi Oshima, Hidetaka Sawada, Fumio Hosokawa, +7

Microscopy

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

Takeo Sasaki, Hidetaka Sawada, F. Hosokawa, +7

Journal of Electron Microscopy

Measurement method of aberration from Ronchigram by autocorrelation function

Hidetaka Sawada, Takumi Sannomiya, F. Hosokawa, +8

Ultramicroscopy

EngineeringMeasurementCalibrationInterferometryEducation +5

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa, +8

Journal of Electron Microscopy

EngineeringMicroscopyOptic DesignElectron OpticCalibration +15

Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector

Hidetaka Sawada, Fumio Hosokawa, T. Kaneyama, +11

Japanese Journal of Applied Physics

EngineeringMicroscopySpherical Aberration CorrectorElectron OpticKv Microscope +17

High energy-resolution electron energy-loss spectroscopy study of the dielectric properties of bulk and nanoparticle LaB6 in the near-infrared region

Yohei Sato, Masami Terauchi, Masaki Mukai, +2

Ultramicroscopy

Materials ScienceDielectric PropertiesNear-infrared RegionEngineeringNanomaterials +9

Higher-order aberration corrector for an image-forming system in a transmission electron microscope

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa, +8

Ultramicroscopy

EngineeringElectron MicroscopyPhysicsMicroscopyOptical Properties +11

The development of a 200kV monochromated field emission electron source

Masaki Mukai, Judy S. Kim, Kazuya Omoto, +9

Ultramicroscopy

Electrical EngineeringPlasma ElectronicsEngineeringRadiation GenerationApplied Physics +4