J. M. Andrews

Electrochemical Charging of Thermal SiO2 Films by Injected Electron Currents

E. H. Nicollian, C. N. Berglund, Péter Schmidt et al. · Journal of Applied Physics · 1971 · 419 citations

Engineering, Charge Transport, Semiconductors +17

Reverse current-voltage characteristics of metal-silicide Schottky diodes

J. M. Andrews, M.P. Lepselter · Solid-State Electronics · 1970 · 310 citations

Semiconductor Technology, Electrical Engineering, Reverse Current-voltage Characteristics +3

Chemical Bonding and Structure of Metal-Semiconductor Interfaces

J. M. Andrews, J. C. Phillips · Physical Review Letters · 1975 · 274 citations

Materials Science, Thin Oxide, Engineering +13

Use of Fluorescently Labeled Phage in the Detection and Identification of Bacterial Species

P.A. Mosier-Boss, Stephen H. Lieberman, J. M. Andrews et al. · Applied Spectroscopy · 2003 · 88 citations

Pathogen Detection, Medicine, Phage P22 +14

The role of the metal-semiconductor interface in silicon integrated circuit technology

J. M. Andrews · Journal of Vacuum Science and Technology · 1974 · 84 citations

Engineering, Device Integration, Semiconductor Physics +24