Sang H. Baeg

Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMs

Qiong Wu, Yuan‐Qing Li, Li Chen et al. · IEEE Transactions on Nuclear Science · 2015 · 34 citations

Engineering, Vlsi Design, Low Supply Voltage +17

A 65 nm Temporally Hardened Flip-Flop Circuit

Y.-Q. Li, Haibin Wang, Rui Liu et al. · IEEE Transactions on Nuclear Science · 2016 · 27 citations

Engineering, Vlsi Design, Computer Architecture +16

New DRAM HCI qualification method emphasizing on repeated memory access

Pierre Chia, Shi-Jie Wen, Sang H. Baeg · 2010 · 14 citations

Hardware Security, Reliability, Reliability Engineering +14

[A clinical study of pyogenic liver abscess at two different local hospitals].

Dae Won Jun, Ji‐Yong Moon, Sang H. Baeg et al. · PubMed · 2005 · 13 citations