Fabrication of nanostructures using scanning probe microscopes

S. Hosaka, Shigeyuki Hosoki, Tsuyoshi Hasegawa, +3

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

EngineeringMicroscopyNanoengineeringAtomic Force MicroscopeNanometrology +16

SPM-based data storage for ultrahigh density recording

S. Hosaka, Atsushi Kikukawa, Hajime Koyanagi, +4

Nanotechnology

EngineeringMicroscopyBiomedical EngineeringData StorageMicroscopy Method +19

Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air

Sumio Hosaka, Hajime Koyanagi, Atsushi Kikukawa

Japanese Journal of Applied Physics

EngineeringMicroscopyEducationVacuum DeviceNanometer Recording +19

High-density thermomagnetic recording method using a scanning tunneling microscope

Jun Nakamura, M. Miyamoto, Sumio Hosaka, +1

Journal of Applied Physics

MagnetismHeating SourceEngineeringTunneling MicroscopyPhysics +12

Megahertz silicon atomic force microscopy (AFM) cantilever and high-speed readout in AFM-based recording

S. Hosaka, K. Etoh, Atsushi Kikukawa, +1

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Atomic Force MicroscopyEngineeringMicroscopyAfm-based RecordingRotation Afm +17

Field evaporation of gold atoms onto a silicon dioxide film by using an atomic force microscope

Hajime Koyanagi, Sumio Hosaka, R. Imura, +1

Applied Physics Letters

EngineeringMicroscopySurface NanotechnologyVacuum DeviceAtomic Force Microscope +17

Side-Wall Measurement using Tilt-Scanning Method in Atomic Force Microscope

Ken Murayama, Satoshi Gonda, Hajime Koyanagi, +2

Japanese Journal of Applied Physics

EngineeringMicroscopyMeasurementMechanical EngineeringEducation +17

Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope

Sumio Hosaka, Atsushi Kikukawa, Yukio Honda, +2

Japanese Journal of Applied Physics

EngineeringMicroscopyMagnetic ResonanceMagnetic Stray FieldProbe Position Control +16

Critical-Dimension Measurement using Multi-Angle-Scanning Method in Atomic Force Microscope

Ken Murayama, Satoshi Gonda, Hajime Koyanagi, +2

Japanese Journal of Applied Physics

EngineeringMicroscopyMeasurementMechanical EngineeringMicroscopy Method +15

Formation of nanometer-sized Au dots on Si substrate in air

Sumio Hosaka, Hajime Koyanagi, Atsushi Kikukawa, +2

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

EngineeringNanoclusterSurface NanotechnologyMetallic NanomaterialsNanoscale Chemistry +17