Atsushi Kikukawa

Silicon <i>pn</i> junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy

Atsushi Kikukawa, Sumio Hosaka, R. Imura · Applied Physics Letters · 1995 · 295 citations

Engineering, Microscopy, Silicon Pn Junctions +16

Vacuum compatible high-sensitive Kelvin probe force microscopy

Atsushi Kikukawa, Sumio Hosaka, R. Imura · Review of Scientific Instruments · 1996 · 109 citations · Full text

Ion Implantation, Engineering, Physics +11

Phase change recording using a scanning near-field optical microscope

Sumio Hosaka, Toshimichi Shintani, M. Miyamoto et al. · Journal of Applied Physics · 1996 · 78 citations

Optical Materials, Engineering, Microscopy +26

SPM-based data storage for ultrahigh density recording

S. Hosaka, Atsushi Kikukawa, Hajime Koyanagi et al. · Nanotechnology · 1997 · 52 citations

Engineering, Microscopy, Biomedical Engineering +21

Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air

Sumio Hosaka, Hajime Koyanagi, Atsushi Kikukawa · Japanese Journal of Applied Physics · 1993 · 47 citations

Engineering, Microscopy, Education +21