L.J. Hanekamp - Concepedia

Author

L.J. Hanekamp

University of Twente

Also Known As

L J Hanekamp, L. J. Hanekamp, L.J. Hanekamp, Lambertus J. Hanekamp

Publications

597

Citations

H-Index

Concepts

All Affiliations

University of Twente Institute for Technical Physics and Materials Science Pennsylvania State University

About

L.J. Hanekamp is an author at University of Twente specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	13	537
2	Applied Physics	11	12	524
3	Chemistry	2	2	25
4	Natural Sciences	1	1	13
5	Chemical Engineering	1	1	12

L.J. Hanekamp

Publications

562

Citations

H-Index

Page 1

	Year	Citations
On the oxide formation on stainless steels AISI 304 and incoloy 800H investigated with XPS J. C. Langevoort, I. Sutherland, L.J. Hanekamp, Applied Surface Science Materials ScienceMaterials EngineeringEngineeringCorrosionOxidation Resistance	1987	147
Determination of complex dielectric functions of ion implanted and implanted-annealed amorphous silicon by spectroscopic ellipsometry M. Fried, T. Lohner, W.A.M. Aarnink, Journal of Applied Physics Optical MaterialsPoint DefectsEngineeringOptoelectronic DevicesIntegrated Circuits	1992	105
Nondestructive determination of damage depth profiles in ion-implanted semiconductors by spectroscopic ellipsometry using different optical models M. Fried, T. Lohner, W.A.M. Aarnink, Journal of Applied Physics Optical MaterialsEngineeringOptical TestingSemiconductorsIon Implantation	1992	86
Ion-implantation induced anomalous surface amorphization in silicon T. Lohner, E. Kótai, N.Q. Khánh, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms Ion ImplantationEngineeringPhysicsAnomalous Surface AmorphizationSurface Science	1994	37
Spectroscopic ellipsometric investigation of clean and oxygen covered copper single crystal surfaces L.J. Hanekamp, Wojciech Lisowski, G.A. Bootsma Surface Science Materials ScienceSurface CharacterizationEngineeringSurface ChemistrySpectroscopic Ellipsometric Investigation	1982	34
Characterization of tungsten tips for STM by SEM/AES/XPS Wojciech Lisowski, Albert van den Berg, Gerhardus A.M. Kip, Fresenius Journal of Analytical Chemistry Materials ScienceSurface CharacterizationEngineeringCorrosionSurface Science	1991	25
Nondestructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry M. Fried, T. Lohner, Johan Nijs, Journal of Applied Physics Silicon-on-insulator StructuresOptical MaterialsEngineeringOptoelectronic DevicesIntegrated Circuits	1989	23
Effects on ellipsometric parameters caused by heat treatment of silicon (111) surface Shinji Kono, L.J. Hanekamp, A. van Silfhout Surface Science Materials ScienceSurface CharacterizationEngineeringSurface AnalysisSurface Science	1977	21
Surface and bulk magnetic behaviour of sputtered CoCr films K. Hemmes, Wojciech Lisowski, J.C. Lodder, Journal of Physics D Applied Physics	1986	15
On the kinetics of oxidation of austenitic stainless steels AISI 304 and incoloy 800H J. C. Langevoort, L.J. Hanekamp, P.J. Gellings Applied Surface Science Materials EngineeringMaterials ScienceEngineeringCorrosionOxidation Resistance	1987	13

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