L.J. Hanekamp

On the oxide formation on stainless steels AISI 304 and incoloy 800H investigated with XPS

J. C. Langevoort, I. Sutherland, L.J. Hanekamp et al. · Applied Surface Science · 1987 · 147 citations · Full text

Materials Science, Materials Engineering, Engineering +7

Determination of complex dielectric functions of ion implanted and implanted-annealed amorphous silicon by spectroscopic ellipsometry

M. Fried, T. Lohner, W.A.M. Aarnink et al. · Journal of Applied Physics · 1992 · 105 citations

Optical Materials, Point Defects, Engineering +23

Nondestructive determination of damage depth profiles in ion-implanted semiconductors by spectroscopic ellipsometry using different optical models

M. Fried, T. Lohner, W.A.M. Aarnink et al. · Journal of Applied Physics · 1992 · 86 citations

Optical Materials, Engineering, Optical Testing +19

Ion-implantation induced anomalous surface amorphization in silicon

T. Lohner, E. Kótai, N.Q. Khánh et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1994 · 37 citations · Full text

Ion Implantation, Engineering, Physics +5

Spectroscopic ellipsometric investigation of clean and oxygen covered copper single crystal surfaces

L.J. Hanekamp, Wojciech Lisowski, G.A. Bootsma · Surface Science · 1982 · 34 citations · Full text

Materials Science, Surface Characterization, Engineering +8