W.A.M. Aarnink

Controlled preparation of all high-Tc SNS-type edge junctions and DC SQUIDs

Ju Gao, W.A.M. Aarnink, G.J. Gerritsma et al. · Physica C Superconductivity · 1990 · 167 citations · Full text

Electrical Engineering, Engineering, Applied Physics +2

Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers

W.A.M. Aarnink, A. Weishaupt, A. van Silfhout · Applied Surface Science · 1990 · 147 citations · Full text

X-ray Crystallography, Materials Science, Thin Layers +11

Determination of complex dielectric functions of ion implanted and implanted-annealed amorphous silicon by spectroscopic ellipsometry

M. Fried, T. Lohner, W.A.M. Aarnink et al. · Journal of Applied Physics · 1992 · 105 citations

Optical Materials, Point Defects, Engineering +23

Nondestructive determination of damage depth profiles in ion-implanted semiconductors by spectroscopic ellipsometry using different optical models

M. Fried, T. Lohner, W.A.M. Aarnink et al. · Journal of Applied Physics · 1992 · 86 citations

Optical Materials, Engineering, Optical Testing +19

Preparation and properties of all high T/sub c/ SNS-type edge DC SQUIDs

Ju Gao, W.A.M. Aarnink, G.J. Gerritsma et al. · IEEE Transactions on Magnetics · 1991 · 43 citations · Full text

Superconducting Material, Engineering, Chemistry +18