A. van Silfhout

Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers

W.A.M. Aarnink, A. Weishaupt, A. van Silfhout · Applied Surface Science · 1990 · 147 citations · Full text

X-ray Crystallography, Materials Science, Thin Layers +11

Typing of <i>Aeromonas</i> strains from patients with diarrhoea and from drinking water

Arie H. Havelaar, Franciska M. Schets, A. van Silfhout et al. · Journal of Applied Bacteriology · 1992 · 106 citations

Determination of complex dielectric functions of ion implanted and implanted-annealed amorphous silicon by spectroscopic ellipsometry

M. Fried, T. Lohner, W.A.M. Aarnink et al. · Journal of Applied Physics · 1992 · 105 citations

Optical Materials, Point Defects, Engineering +23

Optical Characterization of Thin Colloidal Gold Films by Spectroscopic Ellipsometry

E. Stefan Kooij, Herbert Wormeester, E.A.M. Brouwer et al. · Langmuir · 2002 · 100 citations

Atomic Force Microscopy, Optical Materials, Engineering +18

Adsorption of atomic oxygen (N2O) on a clean Si(100) surface and its influence on the surface state density; A comparison with O2

Enrico G. Keim, L. Wolterbeek, A. van Silfhout · Surface Science · 1987 · 98 citations · Full text

Atomic Oxygen, Engineering, Surface Chemistry +8