Electrical Resistance of a Monatomic Step on a Crystal Surface

Iwao Matsuda, Masashi Ueno, Toru Hirahara, +4

Physical Review Letters

Electrical ResistanceEngineeringCharge TransportMicroscope ProbesResistor +16

The effective mass of a free-electron-like surface state of the Si(111)-Ag surface investigated by photoemission and scanning tunneling spectroscopies

Toru Hirahara, Iwao Matsuda, Masashi Ueno, +1

Surface Science

Materials ScienceSurface CharacterizationEngineeringPhysicsSurface Chemistry +8

Electron-Phonon Interaction and Localization of Surface-State Carriers in a Metallic Monolayer

Iwao Matsuda, Canhua Liu, Toru Hirahara, +7

Physical Review Letters

EngineeringTemperature-dependent Electron TransportSilicon On InsulatorCharge TransportNanoelectronics +16

SOI diode uncooled infrared focal plane arrays

Masafumi Kimata, Masashi Ueno, Munehisa Takeda, +1

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Soi DiodeOptical MaterialsEngineeringDevice IntegrationOptoelectronic Devices +20

Two-million-pixel SOI diode uncooled IRFPA with 15μm pixel pitch

Daisuke Fujisawa, Tomohiro Maegawa, Yasuaki Ohta, +9

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Performance of 320 x 240 uncooled IRFPA with SOI diode detectors

Tomohiro Ishikawa, Masashi Ueno, Yoshiyuki Nakaki, +7

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

X 240EngineeringUncooled IrfpaDiode DetectorsSoi Diode Detectors +14

Low-cost 320x240 uncooled IRFPA using a conventional silicon IC process

Tomohiro Ishikawa, Masashi Ueno, Kazuyo Endo, +5

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

X 240EngineeringLow Cost IrfpaSilicon On InsulatorSemiconductor Device +16

640 x 480 pixel uncooled infrared FPA with SOI diode detectors

Masashi Ueno, Yasuhiro Kosasayama, Takaki Sugino, +7

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

X 480EngineeringOptical TestingSoi Diode DetectorsIr Fpa +16

YBaCuO uncooled microbolometer IRFPA

Hideo Wada, Takanori Sone, Hisatoshi Hata, +5

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Optical MaterialsEngineeringYbacuo Bolometer ResistanceThin Film Process TechnologyMicrobolometer Irfpa +17

Effect of graphene on plasmonic metasurfaces at infrared wavelengths

Shinpei Ogawa, Daisuke Fujisawa, Masashi Ueno

AIP Advances

Optical MaterialsEngineeringMetasurfacesMetamaterialsInfrared Transmittance +16