Publication | Closed Access
Electrical Resistance of a Monatomic Step on a Crystal Surface
86
Citations
18
References
2004
Year
Electrical ResistanceEngineeringCharge TransportMicroscope ProbesResistorTunneling MicroscopyElectron SpectroscopyCharge Carrier TransportMaterials SciencePhysicsCrystal MaterialAtomic PhysicsElectron TransportElectrical PropertyCrystallographySurface CharacterizationSpecific ResistanceSurface ScienceApplied PhysicsCondensed Matter PhysicsTunneling Process
We have succeeded in measuring the resistance across a single atomic step through a monatomic-layer metal on a crystal surface, Si(111)(sqrt[3]xsqrt[3])-Ag, using three independent methods, which yielded consistent values of the resistance. Two of the methods were direct measurements with monolithic microscopic four-point probes and four-tip scanning tunneling microscope probes. The third method was the analysis of electron standing waves near step edges, combined with the Landauer formula for 2D conductors. The conductivity across a monatomic step was determined to be about 5 x 10(3) Omega(-1) m(-1). Electron transport across an atomic step is modeled as a tunneling process through an energy-barrier height approximately equal to the work function.
| Year | Citations | |
|---|---|---|
Page 1
Page 1