Mami N. Fujii

Thermal Analysis of Degradation in Ga₂O₃–In₂O₃–ZnO Thin-Film Transistors

Mami N. Fujii, Hiroshi Yano, Tomoaki Hatayama et al. · Japanese Journal of Applied Physics · 2008 · 82 citations

Electrical Engineering, Electronic Devices, Engineering +10

Low temperature high-mobility InZnO thin-film transistors fabricated by excimer laser annealing

Mami N. Fujii, Yasuaki Ishikawa, Ryoichi Ishihara et al. · Applied Physics Letters · 2013 · 45 citations

Materials Science, Semiconductor Technology, Electrical Engineering +12

Density of States in Amorphous In-Ga-Zn-O Thin-Film Transistor under Negative Bias Illumination Stress

Yoshihiro Ueoka, Yasuaki Ishikawa, Juan Paolo Bermundo et al. · ECS Journal of Solid State Science and Technology · 2014 · 39 citations · Full text

Materials Science, Electrical Engineering, Bias Stress +12

Experimental and Theoretical Analysis of Degradation in Ga₂O₃–In₂O₃–ZnO Thin-Film Transistors

Mami N. Fujii, Yukiharu Uraoka, Takashi Fuyuki et al. · Japanese Journal of Applied Physics · 2009 · 34 citations

Materials Science, Theoretical Analysis, Electrical Engineering +13

The Influence of Fluorinated Silicon Nitride Gate Insulator on Positive Bias Stability toward Highly Reliable Amorphous InGaZnO Thin-Film Transistors

Haruka Yamazaki, Yasuaki Ishikawa, Mami N. Fujii et al. · ECS Journal of Solid State Science and Technology · 2013 · 30 citations

Electrical Engineering, Engineering, Nanoelectronics +10