T. Sugii - Concepedia

Author

T. Sugii

Fujitsu (Japan)

Also Known As

T. SUGII, T. Sugii

140

Publications

1.9K

Citations

H-Index

Concepts

All Affiliations

Fujitsu (Japan)University of California, Berkeley Kyoto University

About

T. Sugii is an author at Fujitsu (Japan) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	25	55	1.6K
2	Applied Physics	22	46	1.4K
3	Natural Sciences	4	4	183
4	Education	1	1	13
5	Biomedical Engineering	1	1	16

T. Sugii

Publications

1.7K

Citations

H-Index

Page 1

	Year	Citations
Analytical models for n/sup +/-p/sup +/ double-gate SOI MOSFET's Ken Suzuki, T. Sugii IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringEngineeringAnalytical ModelsNanoelectronics	1995	103
Scaling-parameter-dependent model for subthreshold swing S in double-gate SOI MOSFET's Y. Tosaka, Ken Suzuki, T. Sugii IEEE Electron Device Letters Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringPhysics	1994	97
beta -SiC/Si heterojunction bipolar transistors with high current gain T. Sugii, Takashi Ito, Y. Furumura, IEEE Electron Device Letters SemiconductorsSemiconductor TechnologyElectrical EngineeringElectronic DevicesEngineering	1988	78
Ultrafast operation of V/sub th/-adjusted p/sup +/-n/sup +/ double-gate SOI MOSFET's Tetsu Tanaka, Ken Suzuki, Hiroshi Horie, IEEE Electron Device Letters Electrical EngineeringOscillator Delay TimesVlsi DesignPhysicsEngineering	1994	76
Analytical threshold voltage model for short channel double-gate SOI MOSFETs Ken Suzuki, Y. Tosaka, T. Sugii IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringVlsi Design	1996	64
Dynamic threshold pass-transistor logic for improved delay at lower power supply voltages N. Lindert, T. Sugii, Samuel Tang, IEEE Journal of Solid-State Circuits Low-power ElectronicsHardware SecurityElectrical EngineeringPass-transistor LogicEngineering	1999	60
Analytical threshold voltage model for short channel n/sup +/-p/sup +/ double-gate SOI MOSFETs Ken Suzuki, Y. Tosaka, T. Sugii IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringEngineeringVlsi DesignBias Temperature Instability	1996	57
Low‐Temperature Growth of β ‐ SiC on Si by Gas‐Source MBE T. Sugii, Takayuki Aoyama, Takashi Ito Journal of The Electrochemical Society EngineeringSi Solid SourceSemiconductor DeviceSemiconductorsCarbonization Temperature	1990	45
A new leakage mechanism of Co salicide and optimized process conditions [for CMOS] Ken Goto, A. Fushida, J. Watanabe, IEEE Transactions on Electron Devices Co SalicideChemical EngineeringElectrical EngineeringEngineeringEnvironmental Engineering	1999	43
A thermal activation view of low voltage impact ionization in MOSFETs Pin Su, Ken Goto, T. Sugii, IEEE Electron Device Letters Device ModelingElectrical EngineeringThermal Activation ViewEngineeringIon Implantation	2002	42

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