Shao-Ming Yu

Discrete Dopant Fluctuations in 20-nm/15-nm-Gate Planar CMOS

Yiming Li, Shao-Ming Yu, Jiunn-Ren Hwang et al. · IEEE Transactions on Electron Devices · 2008 · 104 citations

Engineering, Computer Engineering, Electrical Engineering +17

A 25-nm gate-length FinFET transistor module for 32nm node

Chang-Yun Chang, Tsung-Lin Lee, C. Wann et al. · 2009 · 62 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Coupled-Simulation-and-Optimization Approach to Nanodevice Fabrication With Minimization of Electrical Characteristics Fluctuation

Yiming Li, Shao-Ming Yu · IEEE Transactions on Semiconductor Manufacturing · 2007 · 54 citations

Engineering, Computer Engineering, Electrical Engineering +17

Comparison of Random-Dopant-Induced Threshold Voltage Fluctuation in Nanoscale Single-, Double-, and Surrounding-Gate Field-Effect Transistors

Yiming Li, Shao-Ming Yu · Japanese Journal of Applied Physics · 2006 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +17

Strained CMOS Devices With Shallow-Trench-Isolation Stress Buffer Layers

Yiming Li, Hung-Ming Chen, Shao-Ming Yu et al. · IEEE Transactions on Electron Devices · 2008 · 53 citations

Engineering, Electrical Engineering, Microelectronics +16