S. Liu

Modeling the Well-Edge Proximity Effect in Highly Scaled MOSFETs

Yu‐Miin Sheu, Kuan‐Wen Su, Shijie Tian et al. · IEEE Transactions on Electron Devices · 2006 · 58 citations

Engineering, Electrical Engineering, Electronic Materials +16

High performance dual-gate ISFET with non-ideal effect reduction schemes in a SOI-CMOS bioelectrical SoC

Yu-Hui Huang, Chih‐Ying Lin, Jianxun Huang et al. · 2015 · 26 citations

Engineering, Biomedical Engineering, Electrical Engineering +17

3D IC heterogeneous integration of GPS RF receiver, baseband, and DRAM on CoWoS with system BIST solution

Wenxin Liao, H. N. Chen, Kyle Yen et al. · 2013 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +17

An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature

Wei Lee, Pin Su, Hou-Yu Chen et al. · IEEE Electron Device Letters · 2006 · 12 citations

Engineering, Electrical Engineering, Materials Science +17

On the millimeter-wave characteristics and model of on-chip interconnect transmission lines up to 110 GHz

Ming‐Ta Yang, Po‐Hsun Ho, Tzu-Jin Yeh et al. · IEEE MTT-S International Microwave Symposium Digest, 2005. · 2005 · 12 citations

Engineering, Electrical Engineering, Circuit Theory +16