Kang-Deog Suh

Impact of floating gate dry etching on erase characteristics in NOR flash memory

W.H. Lee, Dongkyu Lee, Young-Ho Na et al. · IEEE Electron Device Letters · 2002 · 94 citations

Engineering, Computer Engineering, Electrical Engineering +17

New scaling limitation of the floating gate cell in NAND Flash Memory

Yong Seok Kim, Dong Jun Lee, Chi Kyoung Lee et al. · 2010 · 38 citations

Engineering, Computer Engineering, Computer Science +12

A 90-nm CMOS 1.8-V 2-Gb NAND flash memory for mass storage applications

June Lee, Oh-Suk Kwon, Kyeong-Han Lee et al. · IEEE Journal of Solid-State Circuits · 2003 · 33 citations

Engineering, Computer Engineering, Electrical Engineering +13

An 8gb multi-level NAND flash memory with 63nm STI CMOS process technology

Dae-Seok Byeon, Young-Ho Lim, Jin‐Sung Park et al. · 2005 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +17

The Effect of Trapped Charge Distributions on Data Retention Characteristics of nand Flash Memory Cells

Min Woo Park, Kang-Deog Suh, Keonsoo Kim et al. · IEEE Electron Device Letters · 2007 · 28 citations

Engineering, Computer Engineering, Electrical Engineering +14