F. R. Ladan

Stress and microstructure in tungsten sputtered thin films

Anne‐Marie Haghiri‐Gosnet, F. R. Ladan, Charly Mayeux et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 99 citations

Natural Sciences, Materials Engineering, Materials Science +17

A 100-nm patterned x-ray mask technology based on amorphous SiC membranes

Anne‐Marie Haghiri‐Gosnet, F. Rousseaux, Brahim Kebabi et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1990 · 43 citations

Natural Sciences, Materials Engineering, Materials Science +16

Very high resolution measurement of the penetration depth of superconductors by a novel single-coil inductance technique

Andrea Gauzzi, J. Le Cochec, G. Lamura et al. · Review of Scientific Instruments · 2000 · 41 citations · Full text

Natural Sciences, Materials Science, Physics +14

Photonic bandgap of two-dimensional dielectric crystals

Jean‐Michel Gérard, A. Izraël, J. Y. Marzin et al. · Solid-State Electronics · 1994 · 39 citations

Natural Sciences, Materials Science, Physics +12

Stresses in sputtered tungsten thin films

Anne‐Marie Haghiri‐Gosnet, F. R. Ladan, Charly Mayeux et al. · Applied Surface Science · 1989 · 34 citations

Natural Sciences, Materials Engineering, Materials Science +12