Sung Tae Ahn

Deposition and Electrical Characterization of Very Thin SrTiO₃ Films for Ultra Large Scale Integrated Dynamic Random Access Memory Application

Cheol Seong Hwang, Soon Oh Park, Chang Seok Kang et al. · Japanese Journal of Applied Physics · 1995 · 82 citations

Natural Sciences, Materials Engineering, Materials Science +17

Thermally robust Ta/sub 2/O/sub 5/ capacitor for the 256-Mbit DRAM

Kee-Won Kwon, Changseok Kang, Soon Oh Park et al. · IEEE Transactions on Electron Devices · 1996 · 74 citations

Engineering, Materials Engineering, Materials Science +17

Scaling down of tunnel oxynitride in NAND flash memory: oxynitride selection and reliabilities

Jong-Han Kim, Jung Dal Choi, Wang Chul Shin et al. · 2002 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +15

Improvement of the tunnel oxide quality by a low thermal budget dual oxidation for flash memories

Jong-Han Kim, Sung Tae Ahn · IEEE Electron Device Letters · 1997 · 21 citations

Engineering, Materials Engineering, Materials Science +15

Thermally Robust Ta2O5 Capacitor for the 256-Mbit DRAM

Kee-Won Kwon, Changseok Kang, Ho-Kyu Kang et al. · 1996 · 21 citations

Engineering, Materials Engineering, Materials Science +17