Concepedia
Author
C. DeKeukeleire
Also Known As
1
Publications
73
Citations
H-Index
4
Concepts
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Hot Hole Degradation Effects in Lateral nDMOS Transistors
P. Moens, G. Vandenbosch, C. DeKeukeleire, +3
IEEE Transactions on Electron Devices
Electrical EngineeringSemiconductor DeviceEngineeringLdmos TransistorsStress-induced Leakage Current +7
2004
Page 1