Jimmie J. Wortman

Selective low-pressure chemical vapor deposition of Si1−<i>x</i>Ge<i>x</i> alloys in a rapid thermal processor using dichlorosilane and germane

Y. Zhong, Mehmet C. Öztürk, Douglas T. Grider et al. · Applied Physics Letters · 1990 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +15

A scleral buckle pressure gauge for continuous monitoring of intraocular pressure

Myron L. Wolbarsht, Jimmie J. Wortman, Brad E. Schwartz et al. · International Ophthalmology · 1980 · 32 citations

Engineering, Ophthalmology, Clinical Vision Science +12

Deposition and characterization of polysilicon films deposited by rapid thermal processing

Xiaowei Ren, Mehmet C. Öztürk, Jimmie J. Wortman et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1992 · 18 citations

Natural Sciences, Materials Engineering, Materials Science +17

Low-Pressure Chemical Vapor Deposition of Polycrystalline Silicon and Silicon Dioxide By Rapid Thermal Processing

Mehmet C. Öztürk, Jimmie J. Wortman, Y. Zhong et al. · MRS Proceedings · 1989 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +16

Influence of dry and wet cleaning on the properties of rapid thermal grown and deposited gate dielectrics

Xiaoli Xu, R. T. Kuehn, Mehmet C. Öztürk et al. · Journal of Electronic Materials · 1993 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +16