I. Tarasov

Defect monitoring using scanning photoluminescence spectroscopy in multicrystalline silicon wafers

S. Ostapenko, I. Tarasov, J.P. Kalejs et al. · Semiconductor Science and Technology · 2000 · 75 citations

Engineering, Silicon On Insulator, Defect Tolerance +16

Room-temperature luminescence and electron-beam-induced current (EBIC) recombination behaviour of crystal defects in multicrystalline silicon

M. Kittler, W. Seifert, T. Arguirov et al. · Solar Energy Materials and Solar Cells · 2002 · 53 citations

Electrical Engineering, Engineering, Crystalline Defects +9

Scanning room-temperature photoluminescence in polycrystalline silicon

Yaroslav Koshka, S. Ostapenko, I. Tarasov et al. · Applied Physics Letters · 1999 · 45 citations

Optical Materials, Polycrystalline Silicon Wafers, Engineering +19

Spatially resolved defect diagnostics in multicrystalline silicon for solar cells

I. Tarasov, S. Ostapenko, C Haessler et al. · Materials Science and Engineering B · 2000 · 40 citations

Electrical Engineering, Engineering, Crystalline Defects +9

Residual stresses in polycrystalline silicon sheet and their relation to electron-hole lifetime

Shan He, S. Danyluk, I. Tarasov et al. · Applied Physics Letters · 2006 · 30 citations

Engineering, Mechanical Engineering, Electron-hole Lifetime +17