C Haessler

Defect monitoring using scanning photoluminescence spectroscopy in multicrystalline silicon wafers

S. Ostapenko, I. Tarasov, J.P. Kalejs et al. · Semiconductor Science and Technology · 2000 · 75 citations

Engineering, Silicon On Insulator, Defect Tolerance +16

Nanometer-scale metal precipitates in multicrystalline silicon solar cells

Scott A. McHugo, A. C. Thompson, Azeezulla Nazrulla Mohammed et al. · Journal of Applied Physics · 2001 · 63 citations

Materials Science, Chemical Engineering, Metal Impurity +11

Spatially resolved defect diagnostics in multicrystalline silicon for solar cells

I. Tarasov, S. Ostapenko, C Haessler et al. · Materials Science and Engineering B · 2000 · 40 citations

Electrical Engineering, Engineering, Crystalline Defects +9

Current collecting channels in RGS silicon solar cells—are they useful?

Giso Hahn, D. Sontag, C Haessler · Solar Energy Materials and Solar Cells · 2002 · 19 citations · Full text

Electrical Engineering, Engineering, Solar Cell Structures +5

Defect diagnostics using scanning photoluminescence in multicrystalline silicon

I. Tarasov, S. Ostapenko, V Feifer et al. · Physica B Condensed Matter · 1999 · 15 citations

Photoluminescence, Engineering, Applied Physics +4