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Room-temperature luminescence and electron-beam-induced current (EBIC) recombination behaviour of crystal defects in multicrystalline silicon

Electrical EngineeringEngineeringCrystalline DefectsCrystal DefectsApplied PhysicsDefect FormationSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsMulticrystalline SiliconRoom-temperature LuminescenceSilicon Debugging