U. O. Karlsson

Charge Accumulation at InAs Surfaces

Louise Olsson, C. B. M. Andersson, M.C. Håkansson et al. · Physical Review Letters · 1996 · 294 citations

Surface Characterization, Accumulation Layer, Electrical Engineering +15

Electronic structure of ZnO(0001) studied by angle-resolved photoelectron spectroscopy

R. Girard, O. Tjernberg, G. Chiaia et al. · Surface Science · 1997 · 128 citations

Engineering, Electron Spectroscopy, Oxide Electronics +3

Fine structure of the Ca 2<i>p</i>x-ray-absorption edge for bulk compounds, surfaces, and interfaces

F. J. Himpsel, U. O. Karlsson, A. B. McLean et al. · Physical review. B, Condensed matter · 1991 · 95 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +16

Core level and valence-band studies of the (111)2×2 surfaces of InSb and InAs

Louise Olsson, L. Ilver, J. Kanski et al. · Physical review. B, Condensed matter · 1996 · 48 citations

Engineering, Surface Valence Bands, Electronic Structure +16

Surface science at MAX-LAB

U. O. Karlsson, J. N. Andersen, Kurt Schaldemose Hansen et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1989 · 48 citations

Surface Characterization, Engineering, Surface Analysis +2