Statistics
Publications
4
Citations
185
H-Index
4
Active since
1990
Affiliations
Northwestern University(Current)
B.R. Ryum is an author at Northwestern University specializing in semiconductor devices, engineering, and microelectronics.
Publications per year
1990–1999
4
4
Oxidation-induced traps near SiO2/SiGe interface
C. G. Ahn, H. S. Kang, Y.K. Kwon et al. · Journal of Applied Physics · 1999 · 61 citations · Full text
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