Statistics
Publications
3
Citations
121
H-Index
3
Active since
1999
Affiliations
C. G. Ahn is an author at Electronics and Telecommunications Research Institute specializing in engineering, materials science, and semiconductor devices.
Publications per year
1999–2004
3
3
Oxidation-induced traps near SiO2/SiGe interface
C. G. Ahn, H. S. Kang, Y.K. Kwon et al. · Journal of Applied Physics · 1999 · 61 citations · Full text
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