Impact of oxygen related extended defects on silicon diode characteristics

Jan Vanhellemont, E. Simoen, A. Kaniava, +2

Journal of Applied Physics

EngineeringSilicon On InsulatorSemiconductor DeviceNanoelectronicsElectronic Packaging +15

Impact of Fe and Cu Contamination on the Minority Carrier Lifetime of Silicon Substrates

Antonio Rotondaro, Trace Hurd, A. Kaniava, +5

Journal of The Electrochemical Society

EngineeringSilicon SubstratesIntegrated CircuitsSilicon On InsulatorSemiconductor Device +20

Determination of recombination parameters in silicon wafers by transient microwave absorption

E. Gaubas, A. Kaniava

Review of Scientific Instruments

Transient GratingEngineeringSilicon On InsulatorRf SemiconductorOptical Properties +16

Investigation of recombination parameters in silicon structures by infrared and microwave transient absorption techniques

E. Gaubas, A. Kaniava, J. Vaitkus

Semiconductor Science and Technology

EngineeringSilicon On InsulatorSemiconductor DeviceOptical PropertiesNanoelectronics +14

Recombination activity of iron-related complexes in silicon studied by temperature dependent carrier lifetime measurements

A. Kaniava, Antonio Rotondaro, Jan Vanhellemont, +2

Applied Physics Letters

EngineeringIron ComplexesOptoelectronic DevicesIntegrated CircuitsCarrier Lifetime +15

On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties

Jan Vanhellemont, Eddy Simoen, Cor Claeys, +6

IEEE Transactions on Nuclear Science

EngineeringRadiation Materials ScienceSilicon On InsulatorDefect ToleranceSemiconductor Device +18

A Quantitative Method of Metal Impurities Depth Profiling for Gettering Evaluation in Silicon Wafers

Mohammad Bagher Shabani, Toshihiro Yoshimi, S. Okuuchi, +1

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

Materials ScienceMaterials EngineeringSilicon WafersEngineeringWafer Scale Processing +9

Generation and annealing behaviour of MeV proton and /sup 252/Cf irradiation induced deep levels in silicon diodes

Jan Vanhellemont, A. Kaniava, Eddy Simoen, +6

IEEE Transactions on Nuclear Science

EngineeringNuclear PhysicsSilicon DiodesSilicon On InsulatorSemiconductor Device +14

The response of Si p - n junction diodes to proton irradiation

E. Simoen, Jan Vanhellemont, C. Claeys, +2

Semiconductor Science and Technology

Electrical EngineeringIon ImplantationEngineeringN Junction DiodesPhysics +9

Positron Annihilation Lifetime Study of Irradiated and Deformed Ni

Katsunori Ueno, M. Ohmura, M. Kimura, +6

Materials science forum

Deformed NiPositron Annihilation SpectroscopyNuclear DecayPhysics