A. Kaniava

Impact of oxygen related extended defects on silicon diode characteristics

Jan Vanhellemont, E. Simoen, A. Kaniava et al. · Journal of Applied Physics · 1995 · 73 citations

Engineering, Silicon On Insulator, Semiconductor Device +17

Impact of Fe and Cu Contamination on the Minority Carrier Lifetime of Silicon Substrates

Antonio Rotondaro, Trace Hurd, A. Kaniava et al. · Journal of The Electrochemical Society · 1996 · 55 citations

Engineering, Silicon Substrates, Integrated Circuits +22

Determination of recombination parameters in silicon wafers by transient microwave absorption

E. Gaubas, A. Kaniava · Review of Scientific Instruments · 1996 · 25 citations

Transient Grating, Engineering, Silicon On Insulator +18

Investigation of recombination parameters in silicon structures by infrared and microwave transient absorption techniques

E. Gaubas, A. Kaniava, J. Vaitkus · Semiconductor Science and Technology · 1997 · 25 citations

Engineering, Silicon On Insulator, Semiconductor Device +16

Recombination activity of iron-related complexes in silicon studied by temperature dependent carrier lifetime measurements

A. Kaniava, Antonio Rotondaro, Jan Vanhellemont et al. · Applied Physics Letters · 1995 · 23 citations

Engineering, Iron Complexes, Optoelectronic Devices +17