K.Y.-Y. Doong

Stress-induced voiding and its geometry dependency characterization

K.Y.-Y. Doong, Ruolong Wang, Shao Lin et al. · 2003 · 29 citations

Engineering, Mechanical Engineering, Residual Stress +21

Yield and Reliability Challenges at 7nm and Below

Andrzej J. Strojwas, K.Y.-Y. Doong, Dennis Ciplickas · 2019 Electron Devices Technology and Manufacturing Conference (EDTM) · 2019 · 29 citations

Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM

Jun-Fu Huang, Victor C. Y. Chang, Sally Liu et al. · 2007 · 20 citations

Random On-chip Variation, Engineering, Vlsi Design +16

LOGIC product yield analysis by Wafer Bin Map pattern recognition supervised neural network

F.L. Chen, Sheng-Che Lin, K.Y.-Y. Doong et al. · 2004 · 15 citations

Engineering, Machine Learning, Industrial Engineering +20

Field-Configurable Test Structure Array (FC-TSA): Enabling Design for Monitor, Model, and Manufacturability

K.Y.-Y. Doong, T.J. Bordelon, L.J. Hung et al. · IEEE Transactions on Semiconductor Manufacturing · 2008 · 14 citations

Enabling Design, Engineering, Vlsi Design +21