A. Kita

Reduction of wiring capacitance with new low dielectric SiOF interlayer film for high speed/low power sub-half micron CMOS

Jiro Ida, Masaki Yoshimaru, Teruo Usami et al. · 2002 · 27 citations

Low-power Electronics, Electrical Engineering, Engineering +15

Mechanism of hot carrier induced degradation in MOSFET's

S. Baba, A. Kita, Jun Ueda · 1986 · 26 citations

Device Modeling, Ldd Mosfet, Electrical Engineering +10

A new extraction method for effective channel length on lightly doped drain MOSFET's

Jiro Ida, A. Kita, F. Ichikawa · International Conference on Microelectronic Test Structures · 1990 · 17 citations

Device Modeling, Drain Mosfet, Electrical Engineering +8

Effect of Nitrogen Profile on Tunnel Oxynitride Degradation with Charge Injection Polarity

Tomiyuki Arakawa, Ryoichi Matsumoto, A. Kita · Japanese Journal of Applied Physics · 1996 · 15 citations

Polarity Dependence, Engineering, Tunnel Oxynitride Degradation +19

A 32-bank 256-Mb DRAM with cache and TAG

Satoru Tanoi, Y. Tanaka, T. Tanabe et al. · IEEE Journal of Solid-State Circuits · 1994 · 15 citations

Hardware Security, Electrical Engineering, Negative Conductance +15