I. Morgan

Distributed ESD protection for high-speed integrated circuits

B. Kleveland, Timothy J. Maloney, I. Morgan et al. · IEEE Electron Device Letters · 2000 · 69 citations

Hardware Security, Electrical Engineering, Engineering +11

Developing a transient induced latch-up standard for testing integrated circuits

Mary Alexandria Kelly, L. Henry, Jon Barth et al. · 2003 · 25 citations

Electrical Engineering, Latch Event, Engineering +14

Transient latch-up using an improved bi-polar trigger

I. Morgan, C. Hatchard, Mehrdad Mahanpour · 2003 · 23 citations

Electrical Engineering, Engineering, High Voltage Engineering +7

A formalised performance assessment process to improve audit committee performance in South Africa: A conceptual exploration

I. Morgan · 2010 · 17 citations · Full text

Predicting Future States With $n$ -Dimensional Markov Chains for Fault Diagnosis

I. Morgan, Honghai Liu · IEEE Transactions on Industrial Electronics · 2009 · 14 citations

Fault Diagnosis, Engineering, Machine Learning +23