Myung Kwan Ryu

Bottom-Gate Gallium Indium Zinc Oxide Thin-Film Transistor Array for High-Resolution AMOLED Display

Jang Yeon Kwon, Kyoung Seok Son, Ji Sim Jung et al. · IEEE Electron Device Letters · 2008 · 285 citations

Engineering, Electrical Engineering, Materials Science +15

The influence of SiOx and SiNx passivation on the negative bias stability of Hf–In–Zn–O thin film transistors under illumination

Joon Seok Park, Tae Sang Kim, Kyoung Seok Son et al. · Applied Physics Letters · 2010 · 90 citations

Engineering, Electrical Engineering, Materials Science +17

Role of incorporated hydrogen on performance and photo-bias instability of indium gallium zinc oxide thin film transistors

Hyo Jin Kim, Se Yeob Park, Hong Yoon Jung et al. · Journal of Physics D Applied Physics · 2012 · 81 citations

Engineering, Electrical Engineering, Materials Science +17

Improvement in the device performance of tin-doped indium oxide transistor by oxygen high pressure annealing at 150 °C

Se Yeob Park, Kwang Hwan Ji, Hong Yoon Jung et al. · Applied Physics Letters · 2012 · 59 citations

Engineering, Electrical Engineering, Materials Science +17

The influence of sputtering power and O2/Ar flow ratio on the performance and stability of Hf–In–Zn–O thin film transistors under illumination

Hyun‐Suk Kim, Kyung‐Bae Park, Kyoung Seok Son et al. · Applied Physics Letters · 2010 · 33 citations

Natural Sciences, Materials Engineering, Materials Science +17