Miryeong Song

Comparison of NMOS and PMOS hot carrier effects from 300 to 77 K

Miryeong Song, K.P. MacWilliams, J.C.S. Woo · IEEE Transactions on Electron Devices · 1997 · 86 citations

Engineering, Electrical Engineering, Microelectronics +16

New understanding of LDD CMOS hot-carrier degradation and device lifetime at cryogenic temperatures

J. Wang-Ratkovic, R.C. Lacoe, K.P. MacWilliams et al. · 2002 · 45 citations

Engineering, Electrical Engineering, Aging +16

Accurate determination of ultrathin gate oxide thickness and effective polysilicon doping of CMOS devices

Aniket Gupta, Peng Fang, Miryeong Song et al. · IEEE Electron Device Letters · 1997 · 41 citations

Engineering, Electrical Engineering, Materials Science +17

Evaluation of commercial-off-the-shelf (COTS) electronics for extreme cold environments

Miryeong Song, Jean Yang-Scharlotta, Mohammad Ashtijou et al. · 2018 · 17 citations

Engineering, Aerospace Engineering, Systems Engineering +13

Quantifying ESD/EOS latent damage and integrated circuit leakage currents

Miryeong Song, D. Eng, K.P. MacWilliams · 1995 · 16 citations

Engineering, Electrical Engineering, Electronic Materials +15