Statistics
Publications
2
Citations
27
H-Index
2
Active since
2019
Affiliations
Alain Ostrovsky is an author at Laboratoire d'Électronique des Technologies de l'Information specializing in digital image processing, industrial metrology, and image processing.
Publications per year
2019–2020
2
2
Contour based metrology: getting more from a SEM image
Bertrand Le-Gratiet, R. Bouyssou, J. Ducoté et al. · 2019 · 17 citations
Engineering, Manufacturing Engineering, Image Interpretation +16
Planar microlenses for near infrared CMOS image sensors
Lucie Dilhan, Jérôme Vaillant, Alain Ostrovsky et al. · Electronic Imaging · 2020 · 10 citations · Full text
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