B.M. Armstrong

Low-loss CPW lines on surface stabilized high-resistivity silicon

H.S. Gamble, B.M. Armstrong, S.J.N. Mitchell et al. · IEEE Microwave and Guided Wave Letters · 1999 · 160 citations

Electrical Engineering, Wafer Scale Processing, Engineering +12

SiO/sub 2/ interface layer effects on microwave loss of high-resistivity CPW line

Yunhong Wu, Sarah Gamble, B.M. Armstrong et al. · IEEE Microwave and Guided Wave Letters · 1999 · 117 citations

Electrical Engineering, Engineering, Rf Semiconductor +15

Surface electromigration in copper interconnects

N. D. McCusker, H.S. Gamble, B.M. Armstrong · Microelectronics Reliability · 2000 · 50 citations

Electrical Engineering, Electromigration Technique, Engineering +7

Optimisation and scaling of interfacial GeO2 layers for high-κ gate stacks on germanium and extraction of dielectric constant of GeO2

Shahjahan N. Murad, Paul Baine, David McNeill et al. · Solid-State Electronics · 2012 · 41 citations

Electrical Engineering, Dielectric Constant, Engineering +6

Ultralow Silicon Substrate Noise Crosstalk Using Metal Faraday Cages in an SOI Technology

Stefanos Stefanou, J.S. Hamel, Paul Baine et al. · IEEE Transactions on Electron Devices · 2004 · 39 citations

Engineering, Ultralow Substrate Crosstalk, Silicon On Insulator +16