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Prasad Dasari

PD

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Publications

2

Citations

25

H-Index

2

Active since

2007

Affiliations

Advanced Micro Devices (United States)(Current)

Prasad Dasari is an author at Advanced Micro Devices (United States) specializing in calibration, measurement, and metrology.

Top concepts

Publications per year

2007–2008

2

Publications

2

Evaluating diffraction based overlay metrology for double patterning technologies

Chandra Saru Saravanan, Yongdong Liu, Prasad Dasari et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 13 citations

, , +19

Blossom overlay metrology implementation

Christopher P. Ausschnitt, W. H. Chu, D. Kolor et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 12 citations

, , +16

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