Philippe Candelier

Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model

Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier et al. · 2018 · 54 citations

Engineering, Integrated Circuits, R. Anderson +17

Review of fuse and antifuse solutions for advanced standard CMOS technologies

Élodie Ebrard, Bruno Allard, Philippe Candelier et al. · Microelectronics Journal · 2009 · 39 citations

Power supply glitch attacks: Design and evaluation of detection circuits

Kamil Gomina, Jean-Baptiste Rigaud, Philippe Gendrier et al. · 2014 · 28 citations

Hardware Security, Detection Circuits, Electrical Engineering +12

Resistive memory variability: A simplified trap-assisted tunneling model

Daniele Garbin, Elisa Vianello, Quentin Rafhay et al. · Solid-State Electronics · 2015 · 27 citations

Engineering, Resistive Memory Variability, Computer Engineering +3

Study of resistive random access memory based on TiN/TaOx/TiN integrated into a 65nm advanced complementary metal oxide semiconductor technology

T. Diokh, Elise Le-Roux, S. Jeannot et al. · Thin Solid Films · 2012 · 25 citations

Semiconductor Technology, Non-volatile Memory, Electrical Engineering +8