Young Hee Byun

Unified charge control model and subthreshold current in heterostructure field-effect transistors

Young Hee Byun, K. Lee, M. S. Shur · IEEE Electron Device Letters · 1990 · 91 citations

Engineering, Electrical Engineering, Materials Science +17

A unified current-voltage model for long-channel nMOSFETs

Chan-Kwang Park, Changyeol Lee, Kwyro Lee et al. · IEEE Transactions on Electron Devices · 1991 · 84 citations

Engineering, Electrical Engineering, Materials Science +17

Gate-voltage dependence of source and drain series resistances and effective gate length in GaAs MESFETs

Young Hee Byun, M. S. Shur, A. Peczalski et al. · IEEE Transactions on Electron Devices · 1988 · 49 citations

Engineering, Electrical Engineering, Microelectronics +9

New continuous heterostructure field-effect-transistor model and unified parameter extraction technique

B.-J. Moon, Young Hee Byun, Kyunghan Lee et al. · IEEE Transactions on Electron Devices · 1990 · 44 citations

Engineering, Electrical Engineering, Circuit Theory +16

Modeling and Scaling of a-Si:H and Poly-Si Thin Film Transistors

M. S. Shur, H. C. Slade, Trond Ytterdal et al. · MRS Proceedings · 1997 · 25 citations

Engineering, Electrical Engineering, Materials Science +12