Wenchi Ting

Electrical characteristics of ultrathin oxynitride gate dielectric prepared by rapid thermal oxidation of Si in N2O

Hyunsang Hwang, Wenchi Ting, B. Maiti et al. · Applied Physics Letters · 1990 · 209 citations

Engineering, Materials Engineering, Materials Science +17

Charge-based capacitance measurement for bias-dependent capacitance

Yao‐Wen Chang, Hsing-Wen Chang, Tao‐Cheng Lu et al. · IEEE Electron Device Letters · 2006 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +17

A physical model for boron penetration through an oxynitride gate dielectric prepared by rapid thermal processing in N2O

Hyunsang Hwang, Wenchi Ting, Dim‐Lee Kwong et al. · Applied Physics Letters · 1991 · 21 citations

Engineering, Materials Engineering, Materials Science +17

Comparison of Dielectric Wear-Out Between Oxides Grown in O2 and N2O

Wenchi Ting, G. Q. Lo, Jinho Ahn et al. · 1991 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +12

Novel operation schemes to improve device reliability in a localized trapping storage SONOS-type flash memory

Chi‐Ju Yeh, Wen-Jer Tsai, Tsung‐Chien Lu et al. · 2004 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +12