Philippe Martin-Gonthier

Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose

Vincent Goiffon, Magali Estribeau, Olivier Marcelot et al. · IEEE Transactions on Nuclear Science · 2012 · 100 citations

Total Ionizing Dose, Engineering, Radiation Exposure +20

Evidence of a Novel Source of Random Telegraph Signal in CMOS Image Sensors

Vincent Goiffon, Pierre Magnan, Philippe Martin-Gonthier et al. · IEEE Electron Device Letters · 2011 · 45 citations

Electrical Engineering, Engineering, Radiation Detection +15

Identification of Radiation Induced Dark Current Sources in Pinned Photodiode CMOS Image Sensors

Vincent Goiffon, Cédric Virmontois, Pierre Magnan et al. · IEEE Transactions on Nuclear Science · 2012 · 43 citations

Photoelectric Sensor, Total Ionizing Dose, Radiation Detection +6

RTS noise impact in CMOS image sensors readout circuit

Philippe Martin-Gonthier, Pierre Magnan · 2009 · 41 citations

Image Sensor, Engineering, Mixed-signal Integrated Circuit +10

Dark Count Rate Modeling in Single-Photon Avalanche Diodes

Aymeric Panglosse, Philippe Martin-Gonthier, Olivier Marcelot et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 2020 · 34 citations · Full text

Photonics, Electrical Engineering, Solid-state Lighting +9