Olivier Marcelot

Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose

Vincent Goiffon, Magali Estribeau, Olivier Marcelot et al. · IEEE Transactions on Nuclear Science · 2012 · 100 citations

Total Ionizing Dose, Engineering, Radiation Exposure +20

Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors

Vincent Goiffon, Magali Estribeau, Julien Michelot et al. · IEEE Journal of the Electron Devices Society · 2014 · 49 citations · Full text

Electrical Engineering, Photoelectric Sensor, Engineering +9

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Vincent Goiffon, Serena Rizzolo, Franck Corbiére et al. · IEEE Transactions on Nuclear Science · 2017 · 40 citations

Radiation Exposure, Readout Chain Architecture, Treatment Verification +22

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments

Vincent Goiffon, Sébastien Rolando, Franck Corbiére et al. · IEEE Transactions on Nuclear Science · 2016 · 34 citations

Radiation Hardening, Total Ionizing Dose, Engineering +24

Dark Count Rate Modeling in Single-Photon Avalanche Diodes

Aymeric Panglosse, Philippe Martin-Gonthier, Olivier Marcelot et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 2020 · 34 citations · Full text

Photonics, Electrical Engineering, Solid-state Lighting +9