Franck Corbiére

Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose

Vincent Goiffon, Magali Estribeau, Olivier Marcelot et al. · IEEE Transactions on Nuclear Science · 2012 · 100 citations

Total Ionizing Dose, Engineering, Radiation Exposure +20

Displacement Damage Effects in Pinned Photodiode CMOS Image Sensors

Cédric Virmontois, Vincent Goiffon, Franck Corbiére et al. · IEEE Transactions on Nuclear Science · 2012 · 44 citations

Engineering, Nuclear Physics, Image Sensor +18

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Vincent Goiffon, Serena Rizzolo, Franck Corbiére et al. · IEEE Transactions on Nuclear Science · 2017 · 40 citations

Radiation Exposure, Readout Chain Architecture, Treatment Verification +22

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments

Vincent Goiffon, Sébastien Rolando, Franck Corbiére et al. · IEEE Transactions on Nuclear Science · 2016 · 34 citations

Radiation Hardening, Total Ionizing Dose, Engineering +24

Generic Radiation Hardened Photodiode Layouts for Deep Submicron CMOS Image Sensor Processes

Vincent Goiffon, Paola Cervantes, Cédric Virmontois et al. · IEEE Transactions on Nuclear Science · 2011 · 28 citations

Engineering, Vlsi Design, Integrated Circuits +21