Shahrukh A. Khan

Origin of Low-Frequency Noise in the Low Drain Current Range of Bottom-Gate Amorphous IGZO Thin-Film Transistors

Christoforos Theodorou, A. Tsormpatzoglou, C.A. Dimitriadis et al. · IEEE Electron Device Letters · 2011 · 42 citations

Engineering, Electrical Engineering, Materials Science +17

A Non-volatile Analog Storage Device Using EEPROM Technology

Trevor Blyth, Shahrukh A. Khan, R. Simko · 1991 · 34 citations

Engineering, Computer Engineering, Electrical Engineering +17

High-Frequency Half-Bit Shift Register With Amorphous-Oxide TFT

Abbas Jamshidi-Roudbari, Shahrukh A. Khan, Miltiadis K. Hatalis · IEEE Electron Device Letters · 2010 · 26 citations

Engineering, Electrical Engineering, Materials Science +15

Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements

A. Tsormpatzoglou, N. A. Hastas, Shahrukh A. Khan et al. · IEEE Electron Device Letters · 2012 · 23 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of uniaxial tensile strain on electrical performance of amorphous IGZO TFTs and circuits on flexible Metal foils

Shahrukh A. Khan, Po-Chin Kuo, Abbas Jamshidi-Roudbari et al. · 2010 · 18 citations

Engineering, Electrical Engineering, Materials Science +17