H. Haggag

Test time reduction of successive approximation register A/D converter by selective code measurement

S. Goyal, A. Chatterjee, Mohamed Atia et al. · 2006 · 41 citations

Engineering, Computer Engineering, Electrical Engineering +14

Cmos built-in test architecture for high-speed jitter measurement

Hung-Peng Lin, Kim Taylor, Alex Chong et al. · 2004 · 32 citations

Engineering, Computer Engineering, Electrical Engineering +16

Precision electrical trimming of very low TCR poly-SiGe resistors

J.A. Babcock, P. Francis, Rashid Bashir et al. · IEEE Electron Device Letters · 2000 · 20 citations

Engineering, Electrical Engineering, Materials Science +16

Testing of Precision DAC Using Low-Resolution ADC With Wobbling

Le Jin, H. Haggag, R.L. Geiger et al. · IEEE Transactions on Instrumentation and Measurement · 2008 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +15

Automated test development and test time reduction for RF subsystems

Sule Ozev, Alex Orailoğlu, H. Haggag · 2003 · 16 citations

Engineering, Electrical Engineering, Systems Engineering +15